Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films
                    
                        
                            نویسندگان
                            
                            
                        
                        
                    
                    
                    چکیده
منابع مشابه
Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films
The effect of surface roughness on the Seebeck coefficient in the sub-50-nm scale silicon ultra thin films is investigated theoretically using nonequilibrium Green's function formalism. For systematic studies, the surface roughness is modelled by varying thickness periodically with square wave profile characterized by two parameters: amplitude (A 0) and wavelength (λ). Since high Seebeck coeffi...
متن کاملMagnetic Behavior of Surface Nanostructured 50-nm Nickel Thin Films
Thermally evaporated 50-nm nickel thin films coated on borosilicate glass substrates were nanostructured by excimer laser (0.5 J/cm(2), single shot), DC electric field (up to 2 kV/cm) and trench-template assisted technique. Nanoparticle arrays (anisotropic growth features) have been observed to form in the direction of electric field for DC electric field treatment case and ruptured thin film (...
متن کاملEffect of surface roughness on steel-steel dry friction coefficient
The influence of surface roughness magnitude and direction on dry static friction coefficient between two similar steel samples has been studied through an experiment. A testing apparatus has been designed and fabricated to measure the friction coefficient for a few forms of surface asperity. According to the results of the experiments, dry friction coefficient is affected by both magnitude and...
متن کاملChange of diffused and scattered light with surface roughness of p-type porous Silicon
Porous silicon samples were prepared by electrochemical etching method for different etching times. The structural properties of porous silicon (PS) samples were determined from the Atomic Force Microscopy (AFM) measurements. The surface mean root square roughness (σ rms) changes as function of porosity were studied, and the influence of etching time on porosity and roughness was studied too. U...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Nanoscale Research Letters
سال: 2012
ISSN: 1556-276X
DOI: 10.1186/1556-276x-7-169